In-situ real-time x-ray scattering for probing the processing-structure-performance relation

Handle URI:
http://hdl.handle.net/10754/598603
Title:
In-situ real-time x-ray scattering for probing the processing-structure-performance relation
Authors:
Smilgies, Detlef-M.
Abstract:
© 2014 Materials Research Society. In-situ X-ray scattering methodology is discussed, in order to analyze the microstructure development of soft functional materials during coating, annealing, and drying processes in real-time. The relevance of a fundamental understanding of coating processes for future industrial production is pointed out.
Publisher:
Cambridge University Press (CUP)
Journal:
MRS Proceedings
Conference/Event name:
2014 MRS Spring Meeting
Issue Date:
2014
DOI:
10.1557/opl.2014.583
Type:
Conference Paper
ISSN:
1946-4274
Sponsors:
I am indebted to Aram Amassian and Ruipeng Li (KAUST, Saudi Arabia) as well asGaurav Giri and Zhenan Bao (Stanford) for the great collaboration in developing the in-situsolution shearing set-up. Many of the user groups at D1 station were involved in exploringsolvent vapor processing. Specifically I would like to thank Christine Papadakis (TechnicalUniversity Munich, Germany) and Tobias Hanrath (Cornell) for our long-standingcollaborations. Don Bilderback and Ernie Fontes (CHESS) are thanked for commenting on themanuscript. CHESS is supported by the National Science Foundation and the National Institutesof Health and General Medical Sciences via NSF award DMR-1332208. Equipment funding byKAUST is greatly appreciated.
Appears in Collections:
Publications Acknowledging KAUST Support

Full metadata record

DC FieldValue Language
dc.contributor.authorSmilgies, Detlef-M.en
dc.date.accessioned2016-02-25T13:32:57Zen
dc.date.available2016-02-25T13:32:57Zen
dc.date.issued2014en
dc.identifier.issn1946-4274en
dc.identifier.doi10.1557/opl.2014.583en
dc.identifier.urihttp://hdl.handle.net/10754/598603en
dc.description.abstract© 2014 Materials Research Society. In-situ X-ray scattering methodology is discussed, in order to analyze the microstructure development of soft functional materials during coating, annealing, and drying processes in real-time. The relevance of a fundamental understanding of coating processes for future industrial production is pointed out.en
dc.description.sponsorshipI am indebted to Aram Amassian and Ruipeng Li (KAUST, Saudi Arabia) as well asGaurav Giri and Zhenan Bao (Stanford) for the great collaboration in developing the in-situsolution shearing set-up. Many of the user groups at D1 station were involved in exploringsolvent vapor processing. Specifically I would like to thank Christine Papadakis (TechnicalUniversity Munich, Germany) and Tobias Hanrath (Cornell) for our long-standingcollaborations. Don Bilderback and Ernie Fontes (CHESS) are thanked for commenting on themanuscript. CHESS is supported by the National Science Foundation and the National Institutesof Health and General Medical Sciences via NSF award DMR-1332208. Equipment funding byKAUST is greatly appreciated.en
dc.publisherCambridge University Press (CUP)en
dc.subjectCoatingen
dc.subjectelectronic materialen
dc.subjectsolution depositionen
dc.titleIn-situ real-time x-ray scattering for probing the processing-structure-performance relationen
dc.typeConference Paperen
dc.identifier.journalMRS Proceedingsen
dc.conference.date2014-04-21 to 2014-04-25en
dc.conference.name2014 MRS Spring Meetingen
dc.conference.locationSan Francisco, CA, USAen
dc.contributor.institutionCornell University, Ithaca, United Statesen
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