High Resolution Shear Profile Measurements in Entangled Polymers

Handle URI:
http://hdl.handle.net/10754/598480
Title:
High Resolution Shear Profile Measurements in Entangled Polymers
Authors:
Hayes, Keesha A.; Buckley, Mark R.; Cohen, Itai; Archer, Lynden A.
Abstract:
We use confocal microscopy and particle image velocimetry to visualize motion of 250-300 nm. fluorescent tracer particles in entangled polymers subject to a rectilinear shear flow. Our results show linear velocity profiles in polymer solutions spanning a wide range of molecular weights and number of entanglements (8≤Z≤56), but reveal large differences between the imposed and measured shear rates. These findings disagree with recent reports that shear banding is a characteristic flow response of entangled polymers, and instead point to interfacial slip as an important source of strain loss. © 2008 The American Physical Society.
Citation:
Hayes KA, Buckley MR, Cohen I, Archer LA (2008) High Resolution Shear Profile Measurements in Entangled Polymers. Physical Review Letters 101. Available: http://dx.doi.org/10.1103/PhysRevLett.101.218301.
Publisher:
American Physical Society (APS)
Journal:
Physical Review Letters
Issue Date:
17-Nov-2008
DOI:
10.1103/PhysRevLett.101.218301
PubMed ID:
19113455
Type:
Article
ISSN:
0031-9007; 1079-7114
Sponsors:
This study was supported by the National Science Foundation (DMR0551185 and DMR0606040) and by KAUST-CU Center for Energy and Sustainability. We are grateful to Erik Herz and Ulrich Wiesner for providing fluorescent nanoparticle tracers used in the study.
Appears in Collections:
Publications Acknowledging KAUST Support

Full metadata record

DC FieldValue Language
dc.contributor.authorHayes, Keesha A.en
dc.contributor.authorBuckley, Mark R.en
dc.contributor.authorCohen, Itaien
dc.contributor.authorArcher, Lynden A.en
dc.date.accessioned2016-02-25T13:30:44Zen
dc.date.available2016-02-25T13:30:44Zen
dc.date.issued2008-11-17en
dc.identifier.citationHayes KA, Buckley MR, Cohen I, Archer LA (2008) High Resolution Shear Profile Measurements in Entangled Polymers. Physical Review Letters 101. Available: http://dx.doi.org/10.1103/PhysRevLett.101.218301.en
dc.identifier.issn0031-9007en
dc.identifier.issn1079-7114en
dc.identifier.pmid19113455en
dc.identifier.doi10.1103/PhysRevLett.101.218301en
dc.identifier.urihttp://hdl.handle.net/10754/598480en
dc.description.abstractWe use confocal microscopy and particle image velocimetry to visualize motion of 250-300 nm. fluorescent tracer particles in entangled polymers subject to a rectilinear shear flow. Our results show linear velocity profiles in polymer solutions spanning a wide range of molecular weights and number of entanglements (8≤Z≤56), but reveal large differences between the imposed and measured shear rates. These findings disagree with recent reports that shear banding is a characteristic flow response of entangled polymers, and instead point to interfacial slip as an important source of strain loss. © 2008 The American Physical Society.en
dc.description.sponsorshipThis study was supported by the National Science Foundation (DMR0551185 and DMR0606040) and by KAUST-CU Center for Energy and Sustainability. We are grateful to Erik Herz and Ulrich Wiesner for providing fluorescent nanoparticle tracers used in the study.en
dc.publisherAmerican Physical Society (APS)en
dc.titleHigh Resolution Shear Profile Measurements in Entangled Polymersen
dc.typeArticleen
dc.identifier.journalPhysical Review Lettersen
dc.contributor.institutionCornell University, Ithaca, United Statesen
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