Controlling coverage of solution cast materials with unfavourable surface interactions

Handle URI:
http://hdl.handle.net/10754/597865
Title:
Controlling coverage of solution cast materials with unfavourable surface interactions
Authors:
Burlakov, V. M.; Eperon, G. E.; Snaith, H. J.; Chapman, S. J.; Goriely, A.
Abstract:
Creating uniform coatings of a solution-cast material is of central importance to a broad range of applications. Here, a robust and generic theoretical framework for calculating surface coverage by a solid film of material de-wetting a substrate is presented. Using experimental data from semiconductor thin films as an example, we calculate surface coverage for a wide range of annealing temperatures and film thicknesses. The model generally predicts that for each value of the annealing temperature there is a range of film thicknesses leading to poor surface coverage. The model accurately reproduces solution-cast thin film coverage for organometal halide perovskites, key modern photovoltaic materials, and identifies processing windows for both high and low levels of surface coverage. © 2014 AIP Publishing LLC.
Citation:
Burlakov VM, Eperon GE, Snaith HJ, Chapman SJ, Goriely A (2014) Controlling coverage of solution cast materials with unfavourable surface interactions. Applied Physics Letters 104: 091602. Available: http://dx.doi.org/10.1063/1.4867263.
Publisher:
AIP Publishing
Journal:
Applied Physics Letters
KAUST Grant Number:
KUK-C1-013-04
Issue Date:
3-Mar-2014
DOI:
10.1063/1.4867263
Type:
Article
ISSN:
0003-6951; 1077-3118
Sponsors:
The authors thank Colin Please, Cameron Hall, Giles Richardson, and Jamie Foster for fruitful discussions. This work was supported by EPSRC and Oxford Photovoltaics Ltd., through a Nanotechnology KTN CASE award, the European Research Council (ERC) HYPER PROJECT No. 279881. This publication is based in part upon work supported by Award No. KUK-C1-013-04, made by King Abdullah University of Science and Technology (KAUST). A. G. is a Wolfson/Royal Society Merit Award Holder and acknowledges support from a Reintegration Grant under EC Framework VII. V. M. B. is an Oxford Martin School Fellow and this work was in part supported by the Oxford Martin School. S.J.C. and A. G. acknowledge support from EPSRC Award No. EP/I017070/1.
Appears in Collections:
Publications Acknowledging KAUST Support

Full metadata record

DC FieldValue Language
dc.contributor.authorBurlakov, V. M.en
dc.contributor.authorEperon, G. E.en
dc.contributor.authorSnaith, H. J.en
dc.contributor.authorChapman, S. J.en
dc.contributor.authorGoriely, A.en
dc.date.accessioned2016-02-25T12:58:02Zen
dc.date.available2016-02-25T12:58:02Zen
dc.date.issued2014-03-03en
dc.identifier.citationBurlakov VM, Eperon GE, Snaith HJ, Chapman SJ, Goriely A (2014) Controlling coverage of solution cast materials with unfavourable surface interactions. Applied Physics Letters 104: 091602. Available: http://dx.doi.org/10.1063/1.4867263.en
dc.identifier.issn0003-6951en
dc.identifier.issn1077-3118en
dc.identifier.doi10.1063/1.4867263en
dc.identifier.urihttp://hdl.handle.net/10754/597865en
dc.description.abstractCreating uniform coatings of a solution-cast material is of central importance to a broad range of applications. Here, a robust and generic theoretical framework for calculating surface coverage by a solid film of material de-wetting a substrate is presented. Using experimental data from semiconductor thin films as an example, we calculate surface coverage for a wide range of annealing temperatures and film thicknesses. The model generally predicts that for each value of the annealing temperature there is a range of film thicknesses leading to poor surface coverage. The model accurately reproduces solution-cast thin film coverage for organometal halide perovskites, key modern photovoltaic materials, and identifies processing windows for both high and low levels of surface coverage. © 2014 AIP Publishing LLC.en
dc.description.sponsorshipThe authors thank Colin Please, Cameron Hall, Giles Richardson, and Jamie Foster for fruitful discussions. This work was supported by EPSRC and Oxford Photovoltaics Ltd., through a Nanotechnology KTN CASE award, the European Research Council (ERC) HYPER PROJECT No. 279881. This publication is based in part upon work supported by Award No. KUK-C1-013-04, made by King Abdullah University of Science and Technology (KAUST). A. G. is a Wolfson/Royal Society Merit Award Holder and acknowledges support from a Reintegration Grant under EC Framework VII. V. M. B. is an Oxford Martin School Fellow and this work was in part supported by the Oxford Martin School. S.J.C. and A. G. acknowledge support from EPSRC Award No. EP/I017070/1.en
dc.publisherAIP Publishingen
dc.titleControlling coverage of solution cast materials with unfavourable surface interactionsen
dc.typeArticleen
dc.identifier.journalApplied Physics Lettersen
dc.contributor.institutionMathematical Institute, University of Oxford, Woodstock Rd, Oxford OX2 6GG, United Kingdomen
dc.contributor.institutionClarendon Laboratory, Department of Physics, University of Oxford, Parks Road, Oxford OX1 3PU, United Kingdomen
kaust.grant.numberKUK-C1-013-04en
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