A direct sampling method for inverse electromagnetic medium scattering

Handle URI:
http://hdl.handle.net/10754/597254
Title:
A direct sampling method for inverse electromagnetic medium scattering
Authors:
Ito, Kazufumi; Jin, Bangti; Zou, Jun
Abstract:
In this paper, we study the inverse electromagnetic medium scattering problem of estimating the support and shape of medium scatterers from scattered electric/magnetic near-field data. We shall develop a novel direct sampling method based on an analysis of electromagnetic scattering and the behavior of the fundamental solution. It is applicable to a few incident fields and needs only to compute inner products of the measured scattered field with the fundamental solutions located at sampling points. Hence, it is strictly direct, computationally very efficient and highly robust to the presence of data noise. Two- and three-dimensional numerical experiments indicate that it can provide reliable support estimates for multiple scatterers in the case of both exact and highly noisy data. © 2013 IOP Publishing Ltd.
Citation:
Ito K, Jin B, Zou J (2013) A direct sampling method for inverse electromagnetic medium scattering. Inverse Problems 29: 095018. Available: http://dx.doi.org/10.1088/0266-5611/29/9/095018.
Publisher:
IOP Publishing
Journal:
Inverse Problems
KAUST Grant Number:
KUS-C1-016-04
Issue Date:
1-Sep-2013
DOI:
10.1088/0266-5611/29/9/095018
Type:
Article
ISSN:
0266-5611; 1361-6420
Sponsors:
The authors would like to thank the anonymous referees and the board member for helpful comments, which have significantly improved the quality of the paper. The work of KI was partially supported by the Army Research Office under DAAD19-02-1-0394, US-ARO grant 49308-MA, and US-AFSOR grant FA9550-06-1-0241, that of BJ was supported by award KUS-C1-016-04, made by King Abdullah University of Science and Technology (KAUST), and that of JZ was substantially supported by Hong Kong RGC grants (projects 405110 and 404611).
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Full metadata record

DC FieldValue Language
dc.contributor.authorIto, Kazufumien
dc.contributor.authorJin, Bangtien
dc.contributor.authorZou, Junen
dc.date.accessioned2016-02-25T12:29:04Zen
dc.date.available2016-02-25T12:29:04Zen
dc.date.issued2013-09-01en
dc.identifier.citationIto K, Jin B, Zou J (2013) A direct sampling method for inverse electromagnetic medium scattering. Inverse Problems 29: 095018. Available: http://dx.doi.org/10.1088/0266-5611/29/9/095018.en
dc.identifier.issn0266-5611en
dc.identifier.issn1361-6420en
dc.identifier.doi10.1088/0266-5611/29/9/095018en
dc.identifier.urihttp://hdl.handle.net/10754/597254en
dc.description.abstractIn this paper, we study the inverse electromagnetic medium scattering problem of estimating the support and shape of medium scatterers from scattered electric/magnetic near-field data. We shall develop a novel direct sampling method based on an analysis of electromagnetic scattering and the behavior of the fundamental solution. It is applicable to a few incident fields and needs only to compute inner products of the measured scattered field with the fundamental solutions located at sampling points. Hence, it is strictly direct, computationally very efficient and highly robust to the presence of data noise. Two- and three-dimensional numerical experiments indicate that it can provide reliable support estimates for multiple scatterers in the case of both exact and highly noisy data. © 2013 IOP Publishing Ltd.en
dc.description.sponsorshipThe authors would like to thank the anonymous referees and the board member for helpful comments, which have significantly improved the quality of the paper. The work of KI was partially supported by the Army Research Office under DAAD19-02-1-0394, US-ARO grant 49308-MA, and US-AFSOR grant FA9550-06-1-0241, that of BJ was supported by award KUS-C1-016-04, made by King Abdullah University of Science and Technology (KAUST), and that of JZ was substantially supported by Hong Kong RGC grants (projects 405110 and 404611).en
dc.publisherIOP Publishingen
dc.titleA direct sampling method for inverse electromagnetic medium scatteringen
dc.typeArticleen
dc.identifier.journalInverse Problemsen
dc.contributor.institutionNorth Carolina State University, Raleigh, United Statesen
dc.contributor.institutionUniversity of California, Riverside, Riverside, United Statesen
dc.contributor.institutionChinese University of Hong Kong, Hong Kong, Chinaen
kaust.grant.numberKUS-C1-016-04en
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