Nanoscale microwave microscopy using shielded cantilever probes

Handle URI:
http://hdl.handle.net/10754/597004
Title:
Nanoscale microwave microscopy using shielded cantilever probes
Authors:
Lai, Keji; Kundhikanjana, Worasom; Kelly, Michael A.; Shen, Zhi-Xun
Abstract:
Quantitative dielectric and conductivity mapping in the nanoscale is highly desirable for many research disciplines, but difficult to achieve through conventional transport or established microscopy techniques. Taking advantage of the micro-fabrication technology, we have developed cantilever-based near-field microwave probes with shielded structures. Sensitive microwave electronics and finite-element analysis modeling are also utilized for quantitative electrical imaging. The system is fully compatible with atomic force microscope platforms for convenient operation and easy integration of other modes and functions. The microscope is ideal for interdisciplinary research, with demonstrated examples in nano electronics, physics, material science, and biology.
Citation:
Lai K, Kundhikanjana W, Kelly MA, Shen Z-X (2011) Nanoscale microwave microscopy using shielded cantilever probes. Applied Nanoscience 1: 13–18. Available: http://dx.doi.org/10.1007/s13204-011-0002-7.
Publisher:
Springer Science + Business Media
Journal:
Applied Nanoscience
KAUST Grant Number:
KUS-F1-033-02
Issue Date:
21-Apr-2011
DOI:
10.1007/s13204-011-0002-7
Type:
Article
ISSN:
2190-5509; 2190-5517
Sponsors:
This work is supported by Award No. KUS-F1-033-02, made by King Abdullah University of Science and Technology (KAUST) under the global research partnership (GRP) program. Additional supports are from Center of Probing the Nanoscale (CPN), Stanford University, a gift grant of Agilent Technologies, Inc., NSF Grant DMR-0906027, and DOE under Contract Nos. DE-FG03-01ER45929-A001 and DE-FG36-08GOI8004. CPN is an NSF NSEC, NSF Grant No. PHY-0425897.
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Full metadata record

DC FieldValue Language
dc.contributor.authorLai, Kejien
dc.contributor.authorKundhikanjana, Worasomen
dc.contributor.authorKelly, Michael A.en
dc.contributor.authorShen, Zhi-Xunen
dc.date.accessioned2016-02-23T13:52:17Zen
dc.date.available2016-02-23T13:52:17Zen
dc.date.issued2011-04-21en
dc.identifier.citationLai K, Kundhikanjana W, Kelly MA, Shen Z-X (2011) Nanoscale microwave microscopy using shielded cantilever probes. Applied Nanoscience 1: 13–18. Available: http://dx.doi.org/10.1007/s13204-011-0002-7.en
dc.identifier.issn2190-5509en
dc.identifier.issn2190-5517en
dc.identifier.doi10.1007/s13204-011-0002-7en
dc.identifier.urihttp://hdl.handle.net/10754/597004en
dc.description.abstractQuantitative dielectric and conductivity mapping in the nanoscale is highly desirable for many research disciplines, but difficult to achieve through conventional transport or established microscopy techniques. Taking advantage of the micro-fabrication technology, we have developed cantilever-based near-field microwave probes with shielded structures. Sensitive microwave electronics and finite-element analysis modeling are also utilized for quantitative electrical imaging. The system is fully compatible with atomic force microscope platforms for convenient operation and easy integration of other modes and functions. The microscope is ideal for interdisciplinary research, with demonstrated examples in nano electronics, physics, material science, and biology.en
dc.description.sponsorshipThis work is supported by Award No. KUS-F1-033-02, made by King Abdullah University of Science and Technology (KAUST) under the global research partnership (GRP) program. Additional supports are from Center of Probing the Nanoscale (CPN), Stanford University, a gift grant of Agilent Technologies, Inc., NSF Grant DMR-0906027, and DOE under Contract Nos. DE-FG03-01ER45929-A001 and DE-FG36-08GOI8004. CPN is an NSF NSEC, NSF Grant No. PHY-0425897.en
dc.publisherSpringer Science + Business Mediaen
dc.rightsThis article is distributed under the terms of the Creative Commons Attribution License which permits any use, distribution, and reproduction in any medium, provided the original author(s) and source are credited.en
dc.titleNanoscale microwave microscopy using shielded cantilever probesen
dc.typeArticleen
dc.identifier.journalApplied Nanoscienceen
dc.contributor.institutionDepartment of Physics and Applied Physics, Geballe Laboratory for Advanced Materials, Stanford University, Stanford, CA 94305, USAen
kaust.grant.numberKUS-F1-033-02en
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