Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading

Handle URI:
http://hdl.handle.net/10754/594296
Title:
Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading
Authors:
Mora Cordova, Angel; Khan, Kamran A.; El Sayed, Tamer
Abstract:
We present unified predictions for the crack onset strain, evolution of crack density, and changes in electrical resistance in indium tin oxide/polymer thin films under tensile loading. We propose a damage mechanics model to quantify and predict such changes as an alternative to fracture mechanics formulations. Our predictions are obtained by assuming that there are no flaws at the onset of loading as opposed to the assumptions of fracture mechanics approaches. We calibrate the crack onset strain and the damage model based on experimental data reported in the literature. We predict crack density and changes in electrical resistance as a function of the damage induced in the films. We implement our model in the commercial finite element software ABAQUS using a user subroutine UMAT. We obtain fair to good agreement with experiments. © The Author(s) 2014 Reprints and permissions: sagepub.co.uk/journalsPermissions.nav.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Citation:
Mora A, Khan KA, El Sayed T (2014) Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading. International Journal of Damage Mechanics 24: 546–561. Available: http://dx.doi.org/10.1177/1056789514539362.
Publisher:
SAGE Publications
Journal:
International Journal of Damage Mechanics
Issue Date:
11-Jun-2014
DOI:
10.1177/1056789514539362
Type:
Article
ISSN:
1056-7895; 1530-7921
Sponsors:
This work was fully funded by KAUST's research funds. We thank Prof. Gilles Lubineau and Mohamed A. Nasr Saleh from the COHMAS laboratory at KAUST for their support in providing us with microscope images showing crack evolution.
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorMora Cordova, Angelen
dc.contributor.authorKhan, Kamran A.en
dc.contributor.authorEl Sayed, Tameren
dc.date.accessioned2016-01-19T14:45:27Zen
dc.date.available2016-01-19T14:45:27Zen
dc.date.issued2014-06-11en
dc.identifier.citationMora A, Khan KA, El Sayed T (2014) Prediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loading. International Journal of Damage Mechanics 24: 546–561. Available: http://dx.doi.org/10.1177/1056789514539362.en
dc.identifier.issn1056-7895en
dc.identifier.issn1530-7921en
dc.identifier.doi10.1177/1056789514539362en
dc.identifier.urihttp://hdl.handle.net/10754/594296en
dc.description.abstractWe present unified predictions for the crack onset strain, evolution of crack density, and changes in electrical resistance in indium tin oxide/polymer thin films under tensile loading. We propose a damage mechanics model to quantify and predict such changes as an alternative to fracture mechanics formulations. Our predictions are obtained by assuming that there are no flaws at the onset of loading as opposed to the assumptions of fracture mechanics approaches. We calibrate the crack onset strain and the damage model based on experimental data reported in the literature. We predict crack density and changes in electrical resistance as a function of the damage induced in the films. We implement our model in the commercial finite element software ABAQUS using a user subroutine UMAT. We obtain fair to good agreement with experiments. © The Author(s) 2014 Reprints and permissions: sagepub.co.uk/journalsPermissions.nav.en
dc.description.sponsorshipThis work was fully funded by KAUST's research funds. We thank Prof. Gilles Lubineau and Mohamed A. Nasr Saleh from the COHMAS laboratory at KAUST for their support in providing us with microscope images showing crack evolution.en
dc.publisherSAGE Publicationsen
dc.subjectcrack densityen
dc.subjectDamage mechanicsen
dc.subjectindium tin oxideen
dc.subjectthin filmsen
dc.titlePrediction of crack density and electrical resistance changes in indium tin oxide/polymer thin films under tensile loadingen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalInternational Journal of Damage Mechanicsen
kaust.authorMora Cordova, Angelen
kaust.authorKhan, Kamranen
kaust.authorEl Sayed, Tamer S.en
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