Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices

Handle URI:
http://hdl.handle.net/10754/580007
Title:
Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices
Authors:
Batra, Nitin M ( 0000-0002-6611-7370 ) ; Patole, Shashikant P. ( 0000-0001-6669-6635 ) ; Abdelkader, Ahmed; Anjum, Dalaver H.; Deepak, Francis L; Da Costa, Pedro M. F. J. ( 0000-0002-1993-6701 )
Abstract:
The use of electron and ion beam deposition to make devices containing discrete nanostructures as interconnectors is a well-known nanofabrication process. Classically, one-dimensional materials such as carbon nanotubes (CNTs) have been electrically characterized by resorting to these beam deposition methods. While much attention has been given to the interconnectors, less is known about the contacting electrodes (or leads). In particular, the structure and chemistry of the electrode–interconnector interface is a topic that deserves more attention, as it is critical to understand the device behavior. Here, the structure and chemistry of Pt electrodes, deposited either with electron or ion beams and contacted to a CNT, are analyzed before and after thermally annealing the device in a vacuum. Free-standing Pt nanorods, acting as beam-deposited electrode models, are also characterized pre- and post-annealing. Overall, the as-deposited leads contain a non-negligible amount of amorphous carbon that is consolidated, upon heating, as a partially graphitized outer shell enveloping a Pt core. This observation raises pertinent questions regarding the definition of electrode–nanostructure interfaces in electrical devices, in particular long-standing assumptions of metal-CNT contacts fabricated by direct beam deposition methods.
KAUST Department:
Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division
Citation:
Structural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices 2015, 26 (44):445301 Nanotechnology
Publisher:
IOP Publishing
Journal:
Nanotechnology
Issue Date:
9-Oct-2015
DOI:
10.1088/0957-4484/26/44/445301
Type:
Article
ISSN:
0957-4484; 1361-6528
Additional Links:
http://stacks.iop.org/0957-4484/26/i=44/a=445301?key=crossref.389acc58e510bbe9744026bdd3303a2e
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorBatra, Nitin Men
dc.contributor.authorPatole, Shashikant P.en
dc.contributor.authorAbdelkader, Ahmeden
dc.contributor.authorAnjum, Dalaver H.en
dc.contributor.authorDeepak, Francis Len
dc.contributor.authorDa Costa, Pedro M. F. J.en
dc.date.accessioned2015-10-21T08:59:27Zen
dc.date.available2015-10-21T08:59:27Zen
dc.date.issued2015-10-09en
dc.identifier.citationStructural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devices 2015, 26 (44):445301 Nanotechnologyen
dc.identifier.issn0957-4484en
dc.identifier.issn1361-6528en
dc.identifier.doi10.1088/0957-4484/26/44/445301en
dc.identifier.urihttp://hdl.handle.net/10754/580007en
dc.description.abstractThe use of electron and ion beam deposition to make devices containing discrete nanostructures as interconnectors is a well-known nanofabrication process. Classically, one-dimensional materials such as carbon nanotubes (CNTs) have been electrically characterized by resorting to these beam deposition methods. While much attention has been given to the interconnectors, less is known about the contacting electrodes (or leads). In particular, the structure and chemistry of the electrode–interconnector interface is a topic that deserves more attention, as it is critical to understand the device behavior. Here, the structure and chemistry of Pt electrodes, deposited either with electron or ion beams and contacted to a CNT, are analyzed before and after thermally annealing the device in a vacuum. Free-standing Pt nanorods, acting as beam-deposited electrode models, are also characterized pre- and post-annealing. Overall, the as-deposited leads contain a non-negligible amount of amorphous carbon that is consolidated, upon heating, as a partially graphitized outer shell enveloping a Pt core. This observation raises pertinent questions regarding the definition of electrode–nanostructure interfaces in electrical devices, in particular long-standing assumptions of metal-CNT contacts fabricated by direct beam deposition methods.en
dc.language.isoenen
dc.publisherIOP Publishingen
dc.relation.urlhttp://stacks.iop.org/0957-4484/26/i=44/a=445301?key=crossref.389acc58e510bbe9744026bdd3303a2een
dc.rightsArchived with thanks to Nanotechnologyen
dc.titleStructural changes of electron and ion beam-deposited contacts in annealed carbon-based electrical devicesen
dc.typeArticleen
dc.contributor.departmentImaging and Characterization Core Laben
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalNanotechnologyen
dc.eprint.versionPost-printen
dc.contributor.institutionInternational Iberian Nanotechnology Laboratory, Av. Mestre Jose Veiga, 4715-330 Braga, Portugalen
dc.contributor.affiliationKing Abdullah University of Science and Technology (KAUST)en
kaust.authorBatra, Nitin M.en
kaust.authorPatole, Shashikant P.en
kaust.authorAbdelkader, Ahmeden
kaust.authorAnjum, Dalaver H.en
kaust.authorDa Costa, Pedro M. F. J.en
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