Analog fault diagnosis by inverse problem technique

Handle URI:
http://hdl.handle.net/10754/564469
Title:
Analog fault diagnosis by inverse problem technique
Authors:
Ahmed, Rania F.; Radwan, Ahmed G.; Madian, Ahmed H.; Soliman, Ahmed M.
Abstract:
A novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. © 2011 IEEE.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
ICM 2011 Proceeding
Conference/Event name:
2011 23rd International Conference on Microelectronics, ICM 2011
Issue Date:
Dec-2011
DOI:
10.1109/ICM.2011.6177361
Type:
Conference Paper
ISBN:
9781457722073
Appears in Collections:
Conference Papers; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorAhmed, Rania F.en
dc.contributor.authorRadwan, Ahmed G.en
dc.contributor.authorMadian, Ahmed H.en
dc.contributor.authorSoliman, Ahmed M.en
dc.date.accessioned2015-08-04T07:01:48Zen
dc.date.available2015-08-04T07:01:48Zen
dc.date.issued2011-12en
dc.identifier.isbn9781457722073en
dc.identifier.doi10.1109/ICM.2011.6177361en
dc.identifier.urihttp://hdl.handle.net/10754/564469en
dc.description.abstractA novel algorithm for detecting soft faults in linear analog circuits based on the inverse problem concept is proposed. The proposed approach utilizes optimization techniques with the aid of sensitivity analysis. The main contribution of this work is to apply the inverse problem technique to estimate the actual parameter values of the tested circuit and so, to detect and diagnose single fault in analog circuits. The validation of the algorithm is illustrated through applying it to Sallen-Key second order band pass filter and the results show that the detecting percentage efficiency was 100% and also, the maximum error percentage of estimating the parameter values is 0.7%. This technique can be applied to any other linear circuit and it also can be extended to be applied to non-linear circuits. © 2011 IEEE.en
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.titleAnalog fault diagnosis by inverse problem techniqueen
dc.typeConference Paperen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalICM 2011 Proceedingen
dc.conference.date19 December 2011 through 22 December 2011en
dc.conference.name2011 23rd International Conference on Microelectronics, ICM 2011en
dc.conference.locationHammameten
dc.contributor.institutionElectronics and Communication Department, Fayoum University, Fayoum, Egypten
dc.contributor.institutionApplied Engineering Mathematics Department, Cairo University, Egypten
dc.contributor.institutionDepartment of Engineering, NCRRT, Egyptian Atomic Energy Authority, Egypten
dc.contributor.institutionElectronics Department, Faculty of IET, German University in Cairo (GUC), Egypten
dc.contributor.institutionElectronics and Communication Department, Cairo University, Cairo, Egypten
kaust.authorRadwan, Ahmed G.en
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