Fabrication of tuning-fork based AFM and STM tungsten probe

Handle URI:
http://hdl.handle.net/10754/564460
Title:
Fabrication of tuning-fork based AFM and STM tungsten probe
Authors:
Al-Falih, Hisham; Khan, Yasser; Zhang, Yaping; San Roman Alerigi, Damian ( 0000-0002-3571-6776 ) ; Cha, Dong Kyu; Ooi, Boon S. ( 0000-0001-9606-5578 ) ; Ng, Tien Khee ( 0000-0002-1480-6975 )
Abstract:
We compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Advanced Nanofabrication, Imaging and Characterization Core Lab; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Electrical Engineering Program; Core Labs; Photonics Laboratory
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
8th International Conference on High-capacity Optical Networks and Emerging Technologies
Conference/Event name:
8th International Conference on High-Capacity Optical Networks and Emerging Technologies, HONET 2011
Issue Date:
Dec-2011
DOI:
10.1109/HONET.2011.6149815
Type:
Conference Paper
ISBN:
9781457711695
Appears in Collections:
Conference Papers; Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division; Electrical Engineering Program; Photonics Laboratory; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorAl-Falih, Hishamen
dc.contributor.authorKhan, Yasseren
dc.contributor.authorZhang, Yapingen
dc.contributor.authorSan Roman Alerigi, Damianen
dc.contributor.authorCha, Dong Kyuen
dc.contributor.authorOoi, Boon S.en
dc.contributor.authorNg, Tien Kheeen
dc.date.accessioned2015-08-04T07:01:34Zen
dc.date.available2015-08-04T07:01:34Zen
dc.date.issued2011-12en
dc.identifier.isbn9781457711695en
dc.identifier.doi10.1109/HONET.2011.6149815en
dc.identifier.urihttp://hdl.handle.net/10754/564460en
dc.description.abstractWe compare the sharpness of tungsten probe tips produced by the single-step and two-step dynamic electrochemical etching processes. A small radius of curvature (RoC) of 25 nm or less was routinely obtained when the two-step electrochemical etching (TEE) process was adopted, while the smallest achievable RoC was ∼10 nm, rendering it suitable for atomic force microscopy (AFM) or scanning tunneling microscopy (STM) applications. © 2011 IEEE.en
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.subjectatomic force microscopyen
dc.subjectelectrochemical etchingen
dc.subjectscanning tunneling microscopyen
dc.subjectTungsten probeen
dc.subjecttuning-forken
dc.titleFabrication of tuning-fork based AFM and STM tungsten probeen
dc.typeConference Paperen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Laben
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentElectrical Engineering Programen
dc.contributor.departmentCore Labsen
dc.contributor.departmentPhotonics Laboratoryen
dc.identifier.journal8th International Conference on High-capacity Optical Networks and Emerging Technologiesen
dc.conference.date19 December 2011 through 21 December 2011en
dc.conference.name8th International Conference on High-Capacity Optical Networks and Emerging Technologies, HONET 2011en
dc.conference.locationRiyadhen
kaust.authorKhan, Yasseren
kaust.authorCha, Dong Kyuen
kaust.authorOoi, Boon S.en
kaust.authorNg, Tien Kheeen
kaust.authorAl-Falih, Hishamen
kaust.authorZhang, Yapingen
kaust.authorSan Roman Alerigi, Damianen
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