Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)

Handle URI:
http://hdl.handle.net/10754/564421
Title:
Analysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)
Authors:
Gemma, Ryota; Al-Kassab, Talaat; Kirchheim, Reiner; Pundt, Astrid A.
Abstract:
V-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program
Publisher:
Elsevier BV
Journal:
Journal of Alloys and Compounds
Conference/Event name:
Proceedings of the 12th International Symposium on Metal-Hydrogen Systems, Fundamentals and Applications (MH2010)
Issue Date:
Sep-2011
DOI:
10.1016/j.jallcom.2010.11.122
Type:
Conference Paper
ISSN:
09258388
Appears in Collections:
Conference Papers; Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program

Full metadata record

DC FieldValue Language
dc.contributor.authorGemma, Ryotaen
dc.contributor.authorAl-Kassab, Talaaten
dc.contributor.authorKirchheim, Reineren
dc.contributor.authorPundt, Astrid A.en
dc.date.accessioned2015-08-04T06:27:04Zen
dc.date.available2015-08-04T06:27:04Zen
dc.date.issued2011-09en
dc.identifier.issn09258388en
dc.identifier.doi10.1016/j.jallcom.2010.11.122en
dc.identifier.urihttp://hdl.handle.net/10754/564421en
dc.description.abstractV-Fe5at.% 2 and 10-nm thick single layered films were prepared by ion beam sputtering on W substrate. They were loaded with D from gas phase at 0.2 Pa and at 1 Pa, respectively. Both lateral and depth D distribution of these films was investigated in detail by atom probe tomography. The results of analysis are in good agreement between the average deuterium concentration and the value, expected from electromotive force measurement on a similar flat film. An enrichment of deuterium at the V/W interface was observed for both films. The origin of this D-accumulation was discussed in respect to electron transfer, mechanical stress and misfit dislocations. © 2010 Elsevier B.V. All rights reserved.en
dc.publisherElsevier BVen
dc.subjectAtom probeen
dc.subjectDeuteriumen
dc.subjectHydrogenen
dc.subjectThin filmen
dc.subjectVanadiumen
dc.titleAnalysis of deuterium in V-Fe5at.% film by atom probe tomography (APT)en
dc.typeConference Paperen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentMaterials Science and Engineering Programen
dc.identifier.journalJournal of Alloys and Compoundsen
dc.conference.date19–23 July 2010en
dc.conference.nameProceedings of the 12th International Symposium on Metal-Hydrogen Systems, Fundamentals and Applications (MH2010)en
dc.conference.locationMoscow, Russiaen
dc.contributor.institutionInstitute of Material Physics, University of Göttingen, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germanyen
kaust.authorAl-Kassab, Talaaten
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