Ultra-high resolution optical coherence tomography for encapsulation quality inspection

Handle URI:
http://hdl.handle.net/10754/564419
Title:
Ultra-high resolution optical coherence tomography for encapsulation quality inspection
Authors:
Czajkowski, Jakub; Fabritius, Tapio E J; Ulański, Jacek P.; Marszałek, Tomasz; Gazicki-Lipman, Maciej; Nosal, Andrzej; Śliz, Rafal; Alarousu, Erkki; Prykäri, Tuukka; Myllylä̈, Risto Antero; Jabbour, Ghassan E.
Abstract:
We present the application of ultra-high resolution optical coherence tomography (UHR-OCT) in evaluation of thin, protective films used in printed electronics. Two types of sample were investigated: microscopy glass and organic field effect transistor (OFET) structure. Samples were coated with thin (1-3 μm) layer of parylene C polymer. Measurements were done using experimental UHR-OCT device based on a Kerr-lens mode locked Ti: sapphire femtosecond laser, photonic crystal fibre and modified, free-space Michelson interferometer. Submicron resolution offered by the UHR-OCT system applied in the study enables registration of both interfaces of the thin encapsulation layer. Complete, volumetric characterisation of protective layers is presented, demonstrating possibility to use OCT for encapsulation quality inspection. © Springer-Verlag 2011.
KAUST Department:
Solar and Photovoltaic Engineering Research Center (SPERC)
Publisher:
Springer Nature
Journal:
Applied Physics B
Issue Date:
28-Aug-2011
DOI:
10.1007/s00340-011-4699-5
Type:
Article
ISSN:
09462171
Sponsors:
Presented study was done within PolyNet project and has been funded from the European Community's Seventh Framework Programme (FP7/2007-2013) under the grant agreement No. 214006. In addition, the authors would like to thank the Academy of Finland for the support in their research on UHR-OCT.
Appears in Collections:
Articles; Solar and Photovoltaic Engineering Research Center (SPERC)

Full metadata record

DC FieldValue Language
dc.contributor.authorCzajkowski, Jakuben
dc.contributor.authorFabritius, Tapio E Jen
dc.contributor.authorUlański, Jacek P.en
dc.contributor.authorMarszałek, Tomaszen
dc.contributor.authorGazicki-Lipman, Maciejen
dc.contributor.authorNosal, Andrzejen
dc.contributor.authorŚliz, Rafalen
dc.contributor.authorAlarousu, Erkkien
dc.contributor.authorPrykäri, Tuukkaen
dc.contributor.authorMyllylä̈, Risto Anteroen
dc.contributor.authorJabbour, Ghassan E.en
dc.date.accessioned2015-08-04T06:27:00Zen
dc.date.available2015-08-04T06:27:00Zen
dc.date.issued2011-08-28en
dc.identifier.issn09462171en
dc.identifier.doi10.1007/s00340-011-4699-5en
dc.identifier.urihttp://hdl.handle.net/10754/564419en
dc.description.abstractWe present the application of ultra-high resolution optical coherence tomography (UHR-OCT) in evaluation of thin, protective films used in printed electronics. Two types of sample were investigated: microscopy glass and organic field effect transistor (OFET) structure. Samples were coated with thin (1-3 μm) layer of parylene C polymer. Measurements were done using experimental UHR-OCT device based on a Kerr-lens mode locked Ti: sapphire femtosecond laser, photonic crystal fibre and modified, free-space Michelson interferometer. Submicron resolution offered by the UHR-OCT system applied in the study enables registration of both interfaces of the thin encapsulation layer. Complete, volumetric characterisation of protective layers is presented, demonstrating possibility to use OCT for encapsulation quality inspection. © Springer-Verlag 2011.en
dc.description.sponsorshipPresented study was done within PolyNet project and has been funded from the European Community's Seventh Framework Programme (FP7/2007-2013) under the grant agreement No. 214006. In addition, the authors would like to thank the Academy of Finland for the support in their research on UHR-OCT.en
dc.publisherSpringer Natureen
dc.titleUltra-high resolution optical coherence tomography for encapsulation quality inspectionen
dc.typeArticleen
dc.contributor.departmentSolar and Photovoltaic Engineering Research Center (SPERC)en
dc.identifier.journalApplied Physics Ben
dc.contributor.institutionOptoelectronics and Measurement Techniques Laboratory, University of Oulu, P.O. Box 4500, 90014 Oulu, Finlanden
dc.contributor.institutionDepartment of Molecular Physics, Technical University of Łódz, 90-924 Łódz, Polanden
dc.contributor.institutionInstitute of Mechanical Engineering, Technical University of Łódź, 90-924 Łódź, Polanden
kaust.authorAlarousu, Erkkien
kaust.authorJabbour, Ghassan E.en
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