Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

Handle URI:
http://hdl.handle.net/10754/564044
Title:
Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam
Authors:
Alaie, Seyedhamidreza; Goettler, Drew F.; Jiang, Yingbing; Abbas, Khawar; Baboly, Mohammadhosein Ghasemi; Anjum, Dalaver H.; Chaieb, Sahraoui ( 0000-0002-8053-3610 ) ; Leseman, Zayd Chad
Abstract:
Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.
KAUST Department:
Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division; Mechanical Engineering Program; Core Labs
Publisher:
IOP Publishing
Journal:
Nanotechnology
Issue Date:
4-Feb-2015
DOI:
10.1088/0957-4484/26/8/085704
Type:
Article
ISSN:
09574484
Sponsors:
This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division; Mechanical Engineering Program

Full metadata record

DC FieldValue Language
dc.contributor.authorAlaie, Seyedhamidrezaen
dc.contributor.authorGoettler, Drew F.en
dc.contributor.authorJiang, Yingbingen
dc.contributor.authorAbbas, Khawaren
dc.contributor.authorBaboly, Mohammadhosein Ghasemien
dc.contributor.authorAnjum, Dalaver H.en
dc.contributor.authorChaieb, Sahraouien
dc.contributor.authorLeseman, Zayd Chaden
dc.date.accessioned2015-08-03T12:29:37Zen
dc.date.available2015-08-03T12:29:37Zen
dc.date.issued2015-02-04en
dc.identifier.issn09574484en
dc.identifier.doi10.1088/0957-4484/26/8/085704en
dc.identifier.urihttp://hdl.handle.net/10754/564044en
dc.description.abstractPt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.en
dc.description.sponsorshipThis work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.en
dc.publisherIOP Publishingen
dc.subjectcharecterizationen
dc.subjectfocused ion beamen
dc.subjectnanocrystallineen
dc.subjectnanosampleen
dc.subjectplatinumen
dc.subjectsuspended membranesen
dc.subjectthermal conductivityen
dc.titleThermal conductivity and nanocrystalline structure of platinum deposited by focused ion beamen
dc.typeArticleen
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Laben
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentMechanical Engineering Programen
dc.contributor.departmentCore Labsen
dc.identifier.journalNanotechnologyen
dc.contributor.institutionDepartment of Mechanical Engineering, University of New MexicoAlbuquerque, NM, United Statesen
dc.contributor.institutionTEM Laboratory, University of New MexicoAlbuquerque, NM, United Statesen
dc.contributor.institutionDepartment of Physics and Astronomy, University of New MexicoAlbuquerque, NM, United Statesen
dc.contributor.institutionManufacturing Training and Technology Center-Nanofabrication Facility, University of New MexicoAlbuquerque, NM, United Statesen
kaust.authorAnjum, Dalaver H.en
kaust.authorChaieb, Sahraouien
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