Shrinkage-thresholding enhanced born iterative method for solving 2D inverse electromagnetic scattering problem

Handle URI:
http://hdl.handle.net/10754/563618
Title:
Shrinkage-thresholding enhanced born iterative method for solving 2D inverse electromagnetic scattering problem
Authors:
Desmal, Abdulla ( 0000-0003-0861-8908 ) ; Bagci, Hakan ( 0000-0003-3867-5786 )
Abstract:
A numerical framework that incorporates recently developed iterative shrinkage thresholding (IST) algorithms within the Born iterative method (BIM) is proposed for solving the two-dimensional inverse electromagnetic scattering problem. IST algorithms minimize a cost function weighted between measurement-data misfit and a zeroth/first-norm penalty term and therefore promote "sharpness" in the solution. Consequently, when applied to domains with sharp variations, discontinuities, or sparse content, the proposed framework is more efficient and accurate than the "classical" BIM that minimizes a cost function with a second-norm penalty term. Indeed, numerical results demonstrate the superiority of the IST-BIM over the classical BIM when they are applied to sparse domains: Permittivity and conductivity profiles recovered using the IST-BIM are sharper and more accurate and converge faster. © 1963-2012 IEEE.
KAUST Department:
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Center for Uncertainty Quantification in Computational Science and Engineering (SRI-UQ); Electrical Engineering Program; Computational Electromagnetics Laboratory
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
IEEE Transactions on Antennas and Propagation
Issue Date:
Jul-2014
DOI:
10.1109/TAP.2014.2321144
Type:
Article
ISSN:
0018926X
Appears in Collections:
Articles; Electrical Engineering Program; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorDesmal, Abdullaen
dc.contributor.authorBagci, Hakanen
dc.date.accessioned2015-08-03T12:04:30Zen
dc.date.available2015-08-03T12:04:30Zen
dc.date.issued2014-07en
dc.identifier.issn0018926Xen
dc.identifier.doi10.1109/TAP.2014.2321144en
dc.identifier.urihttp://hdl.handle.net/10754/563618en
dc.description.abstractA numerical framework that incorporates recently developed iterative shrinkage thresholding (IST) algorithms within the Born iterative method (BIM) is proposed for solving the two-dimensional inverse electromagnetic scattering problem. IST algorithms minimize a cost function weighted between measurement-data misfit and a zeroth/first-norm penalty term and therefore promote "sharpness" in the solution. Consequently, when applied to domains with sharp variations, discontinuities, or sparse content, the proposed framework is more efficient and accurate than the "classical" BIM that minimizes a cost function with a second-norm penalty term. Indeed, numerical results demonstrate the superiority of the IST-BIM over the classical BIM when they are applied to sparse domains: Permittivity and conductivity profiles recovered using the IST-BIM are sharper and more accurate and converge faster. © 1963-2012 IEEE.en
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.subjectBorn iterative methoden
dc.subjectiterative shrinkage thresholding algorithmsen
dc.subjectmicrowave imagingen
dc.subjectregularizationen
dc.titleShrinkage-thresholding enhanced born iterative method for solving 2D inverse electromagnetic scattering problemen
dc.typeArticleen
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentCenter for Uncertainty Quantification in Computational Science and Engineering (SRI-UQ)en
dc.contributor.departmentElectrical Engineering Programen
dc.contributor.departmentComputational Electromagnetics Laboratoryen
dc.identifier.journalIEEE Transactions on Antennas and Propagationen
kaust.authorBagci, Hakanen
kaust.authorDesmal, Abdullaen
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