Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport

Handle URI:
http://hdl.handle.net/10754/562273
Title:
Direct structural mapping of organic field-effect transistors reveals bottlenecks to carrier transport
Authors:
Li, Ruipeng; Ward, Jeremy W.; Smilgies, Detlef Matthias; Payne, Marcia M.; Anthony, John Edward; Jurchescu, Oana D.; Amassian, Aram ( 0000-0002-5734-1194 )
Abstract:
X-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program; Solar and Photovoltaic Engineering Research Center (SPERC); Organic Electronics and Photovoltaics Group
Publisher:
Wiley-VCH Verlag
Journal:
Advanced Materials
Issue Date:
10-Aug-2012
DOI:
10.1002/adma.201201856
PubMed ID:
22887742
Type:
Article
ISSN:
09359648
Sponsors:
We are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division; Materials Science and Engineering Program; Solar and Photovoltaic Engineering Research Center (SPERC)

Full metadata record

DC FieldValue Language
dc.contributor.authorLi, Ruipengen
dc.contributor.authorWard, Jeremy W.en
dc.contributor.authorSmilgies, Detlef Matthiasen
dc.contributor.authorPayne, Marcia M.en
dc.contributor.authorAnthony, John Edwarden
dc.contributor.authorJurchescu, Oana D.en
dc.contributor.authorAmassian, Aramen
dc.date.accessioned2015-08-03T09:58:57Zen
dc.date.available2015-08-03T09:58:57Zen
dc.date.issued2012-08-10en
dc.identifier.issn09359648en
dc.identifier.pmid22887742en
dc.identifier.doi10.1002/adma.201201856en
dc.identifier.urihttp://hdl.handle.net/10754/562273en
dc.description.abstractX-ray microbeam scattering is used to map the microstructure of the organic semiconductor along the channel length of solution-processed bottom-contact OFET devices. Contact-induced nucleation is known to influence the crystallization behavior within the channel. We find that microstructural inhomogeneities in the center of the channel act as a bottleneck to charge transport. This problem can be overcome by controlling crystallization of the preferable texture, thus favoring more efficient charge transport throughout the channel. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.en
dc.description.sponsorshipWe are grateful to Mr. Mohammed Balamesh for his important contributions to the operational readiness of the Organic Electronics and Photovoltaics Laboratory at King Abdullah University of Science and Technology. Part of this work was supported by KAUST's Office of Competitive Research Funds under award number FIC/2010/04. We acknowledge use of the D1 beam line at the Cornell High Energy Synchrotron Source supported by the National Science Foundation (NSF DMR-0225180) and NIH-NIGMS. JWW and ODJ acknowledge financial support from the National Science Foundation (ECCS-1102275). We thank Jake Mohin (Carnegie-Mellon University) and Dave Schuller (MacCHESS) for their help with the micrograph metrology software as well as Sterling Cornaby, Tom Szebenyi, and Don Bilderback (CHESS) for providing the high-quality x-ray focusing capillary.en
dc.publisherWiley-VCH Verlagen
dc.subjectμGIWAXSen
dc.subjectdif-TES-ADTen
dc.subjectmicrobeamen
dc.subjectOTFTen
dc.titleDirect structural mapping of organic field-effect transistors reveals bottlenecks to carrier transporten
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentMaterials Science and Engineering Programen
dc.contributor.departmentSolar and Photovoltaic Engineering Research Center (SPERC)en
dc.contributor.departmentOrganic Electronics and Photovoltaics Groupen
dc.identifier.journalAdvanced Materialsen
dc.contributor.institutionDepartment of Physics, Wake Forest University, Winston-Salem, NC 27109, United Statesen
dc.contributor.institutionCornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14850, United Statesen
dc.contributor.institutionDepartment of Chemistry, University of Kentucky, Lexington, KY 40506, United Statesen
kaust.authorLi, Ruipengen
kaust.authorAmassian, Aramen

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