Reflection and transmission of normally incident full-vector X waves on planar interfaces

Handle URI:
http://hdl.handle.net/10754/561962
Title:
Reflection and transmission of normally incident full-vector X waves on planar interfaces
Authors:
Salem, Mohamed; Bagci, Hakan ( 0000-0003-3867-5786 )
Abstract:
The reflection and transmission of full-vector X waves normally incident on planar half-spaces and slabs are studied. For this purpose, X waves are expanded in terms of weighted vector Bessel beams; this new decomposition and reconstruction method offers a more lucid and intuitive interpretation of the physical phenomena observed upon the reflection or transmission of X waves when compared to the conventional plane-wave decomposition technique. Using the Bessel beam expansion approach, we have characterized changes in the field shape and the intensity distribution of the transmitted and reflected full-vector X waves. We have also identified a novel longitudinal shift, which is observed when a full-vector X wave is transmitted through a dielectric slab under frustrated total reflection condition. The results of our studies presented here are valuable in understanding the behavior of full-vector X waves when they are utilized in practical applications in electromagnetics, optics, and photonics, such as trap and tweezer setups, optical lithography, and immaterial probing. © 2011 Optical Society of America.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Electrical Engineering Program; Computational Electromagnetics Laboratory
Publisher:
The Optical Society
Journal:
Journal of the Optical Society of America A
Issue Date:
23-Dec-2011
DOI:
10.1364/JOSAA.29.000139
Type:
Article
ISSN:
10847529
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division; Electrical Engineering Program; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorSalem, Mohameden
dc.contributor.authorBagci, Hakanen
dc.date.accessioned2015-08-03T09:35:07Zen
dc.date.available2015-08-03T09:35:07Zen
dc.date.issued2011-12-23en
dc.identifier.issn10847529en
dc.identifier.doi10.1364/JOSAA.29.000139en
dc.identifier.urihttp://hdl.handle.net/10754/561962en
dc.description.abstractThe reflection and transmission of full-vector X waves normally incident on planar half-spaces and slabs are studied. For this purpose, X waves are expanded in terms of weighted vector Bessel beams; this new decomposition and reconstruction method offers a more lucid and intuitive interpretation of the physical phenomena observed upon the reflection or transmission of X waves when compared to the conventional plane-wave decomposition technique. Using the Bessel beam expansion approach, we have characterized changes in the field shape and the intensity distribution of the transmitted and reflected full-vector X waves. We have also identified a novel longitudinal shift, which is observed when a full-vector X wave is transmitted through a dielectric slab under frustrated total reflection condition. The results of our studies presented here are valuable in understanding the behavior of full-vector X waves when they are utilized in practical applications in electromagnetics, optics, and photonics, such as trap and tweezer setups, optical lithography, and immaterial probing. © 2011 Optical Society of America.en
dc.publisherThe Optical Societyen
dc.titleReflection and transmission of normally incident full-vector X waves on planar interfacesen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentElectrical Engineering Programen
dc.contributor.departmentComputational Electromagnetics Laboratoryen
dc.identifier.journalJournal of the Optical Society of America Aen
kaust.authorSalem, Mohameden
kaust.authorBagci, Hakanen
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