Design and finite element method analysis of laterally actuated multi-value nano electromechanical switches

Handle URI:
http://hdl.handle.net/10754/561864
Title:
Design and finite element method analysis of laterally actuated multi-value nano electromechanical switches
Authors:
Kloub, Hussam; Smith, Casey; Hussain, Muhammad Mustafa ( 0000-0003-3279-0441 )
Abstract:
We report on the design and modeling of novel nano electromechanical switches suitable for implementing reset/set flip-flops, AND, NOR, and XNOR Boolean functions. Multiple logic operations can be implemented using only one switching action enabling parallel data processing; a feature that renders this design competitive with complementary metal oxide semiconductor and superior to conventional nano-electromechanical switches in terms of functionality per device footprint. The structural architecture of the newly designed switch consists of a pinned flexural beam structure which allows low strain lateral actuation for enhanced mechanical integrity. Reliable control of on-state electrical current density is achieved through the use of metal-metal contacts, true parallel beam deflection, and lithographically defined contact area to prevent possible device welding. Dynamic response as a function of device dimensions numerically investigated using ANSYS and MatLab Simulink. © 2011 The Japan Society of Applied Physics.
KAUST Department:
Integrated Nanotechnology Lab; Physical Sciences and Engineering (PSE) Division; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Electrical Engineering Program
Publisher:
Japan Society of Applied Physics
Journal:
Japanese Journal of Applied Physics
Issue Date:
Sep-2011
DOI:
10.1143/JJAP.50.094301
Type:
Article
ISSN:
00214922
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division; Electrical Engineering Program; Integrated Nanotechnology Lab; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorKloub, Hussamen
dc.contributor.authorSmith, Caseyen
dc.contributor.authorHussain, Muhammad Mustafaen
dc.date.accessioned2015-08-03T09:32:47Zen
dc.date.available2015-08-03T09:32:47Zen
dc.date.issued2011-09en
dc.identifier.issn00214922en
dc.identifier.doi10.1143/JJAP.50.094301en
dc.identifier.urihttp://hdl.handle.net/10754/561864en
dc.description.abstractWe report on the design and modeling of novel nano electromechanical switches suitable for implementing reset/set flip-flops, AND, NOR, and XNOR Boolean functions. Multiple logic operations can be implemented using only one switching action enabling parallel data processing; a feature that renders this design competitive with complementary metal oxide semiconductor and superior to conventional nano-electromechanical switches in terms of functionality per device footprint. The structural architecture of the newly designed switch consists of a pinned flexural beam structure which allows low strain lateral actuation for enhanced mechanical integrity. Reliable control of on-state electrical current density is achieved through the use of metal-metal contacts, true parallel beam deflection, and lithographically defined contact area to prevent possible device welding. Dynamic response as a function of device dimensions numerically investigated using ANSYS and MatLab Simulink. © 2011 The Japan Society of Applied Physics.en
dc.publisherJapan Society of Applied Physicsen
dc.titleDesign and finite element method analysis of laterally actuated multi-value nano electromechanical switchesen
dc.typeArticleen
dc.contributor.departmentIntegrated Nanotechnology Laben
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentElectrical Engineering Programen
dc.identifier.journalJapanese Journal of Applied Physicsen
kaust.authorKloub, Hussamen
kaust.authorSmith, Caseyen
kaust.authorHussain, Muhammad Mustafaen
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