Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope

Handle URI:
http://hdl.handle.net/10754/561813
Title:
Novel parallel plate condenser for single particle electrostatic force measurements in atomic force microscope
Authors:
Kwek, Jin Wang; Vakarelski, Ivan Uriev ( 0000-0001-9244-9160 ) ; Ng, Waikiong; Heng, Jerry; Tan, Reginald
Abstract:
A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday's pail technique. © 2011 Elsevier B.V.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Publisher:
Elsevier
Journal:
Colloids and Surfaces A: Physicochemical and Engineering Aspects
Issue Date:
Jul-2011
DOI:
10.1016/j.colsurfa.2011.06.008
Type:
Article
ISSN:
09277757
Sponsors:
The project was supported by the Science and Engineering Research Council of A*STAR (Agency for Science, Technology and Research) in Singapore.
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorKwek, Jin Wangen
dc.contributor.authorVakarelski, Ivan Urieven
dc.contributor.authorNg, Waikiongen
dc.contributor.authorHeng, Jerryen
dc.contributor.authorTan, Reginalden
dc.date.accessioned2015-08-03T09:05:12Zen
dc.date.available2015-08-03T09:05:12Zen
dc.date.issued2011-07en
dc.identifier.issn09277757en
dc.identifier.doi10.1016/j.colsurfa.2011.06.008en
dc.identifier.urihttp://hdl.handle.net/10754/561813en
dc.description.abstractA combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105-150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on a particle in an applied electrical field to be performed in ambient air conditions. By varying the position of the microparticle between the electrodes and the strength of the applied electric field, the relative contributions of the particle net charge, induced and image charges were investigated. When the microparticle is positioned in the middle of the electrodes, the force acting on the microparticle was linear with the applied electric field and proportional to the microparticle net charge. At distances close to the bottom electrode, the force follows a parabolic relationship with the applied electric field reflecting the contributions of induced and image charges. The method can be used for the rapid evaluation of the charging and polarizability properties of the microparticle as well as an alternative to the conventional Faraday's pail technique. © 2011 Elsevier B.V.en
dc.description.sponsorshipThe project was supported by the Science and Engineering Research Council of A*STAR (Agency for Science, Technology and Research) in Singapore.en
dc.publisherElsevieren
dc.subjectAtomic force microscopeen
dc.subjectElectrostatic forcesen
dc.subjectMicroparticlesen
dc.titleNovel parallel plate condenser for single particle electrostatic force measurements in atomic force microscopeen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalColloids and Surfaces A: Physicochemical and Engineering Aspectsen
dc.contributor.institutionInstitute of Chemical and Engineering Sciences, 1 Pesek Road, Jurong Island, SG 627833, Singaporeen
dc.contributor.institutionDepartment of Chemical Engineering, Imperial College London, South Kensington Campus, London SW7 2AZ, United Kingdomen
dc.contributor.institutionDepartment of Chemical and Biomolecular Engineering, National University of Singapore, 4 Engineering Drive 4, SG 117576, Singaporeen
kaust.authorVakarelski, Ivan Urieven
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