A well-conditioned integral-equation formulation for efficient transient analysis of electrically small microelectronic devices

Handle URI:
http://hdl.handle.net/10754/561470
Title:
A well-conditioned integral-equation formulation for efficient transient analysis of electrically small microelectronic devices
Authors:
Bagci, Hakan ( 0000-0003-3867-5786 ) ; Andriulli, Francesco P.; Vipiana, Francesca; Vecchi, Giuseppe; Michielssen, Eric
Abstract:
A hierarchically regularized coupled set of time-domain surface and volume electric field integral-equations (TD-S-EFIE and TD-V-EFIE) for analyzing electromagnetic wave interactions with electrically small and geometrically intricate composite structures comprising perfect electrically conducting surfaces and finite dielectric volumes is presented. A classically formulated coupled set of TD-S- and V-EFIEs is shown to be ill-conditioned at low frequencies owing to the hypersingular nature of the TD-S-EFIE. To eliminate low-frequency breakdown in marching-on-in-time solvers for these coupled equations, a hierarchical regularizer leveraging generalized RaoWiltonGlisson functions is applied to the TD-S-EFIE; no regularization is applied to the TD-V-EFIE as it is protected from low-frequency breakdown by an identity term. The resulting hierarchically regularized hybrid TD-S- and V-EFIE solver is applicable to the analysis of wave interactions with electrically small and densely meshed structures of arbitrary topology. The accuracy, efficiency, and applicability of the proposed solver are demonstrated by analyzing crosstalk in a six-port transmission line, radiation from a miniature radio-frequency identification antenna, and, plane-wave coupling onto a partially-shielded and fully loaded two-layer computer board. © 2006 IEEE.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Electrical Engineering Program; Computational Electromagnetics Laboratory
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
IEEE Transactions on Advanced Packaging
Issue Date:
May-2010
DOI:
10.1109/TADVP.2009.2033569
Type:
Article
ISSN:
15213323
Sponsors:
Manuscript received December 04, 2008; revised July 16, 2009. Current version published May 05, 2010. This work was supported in part by AFOSR MURI under Grant F014432-051936 aimed at modeling installed antennas and their feeds and in part by the National Science Foundation under Grant DMS 0713771. This work was recommended for publication by Associate Editor A. Maffucci upon evaluation of the reviewers comments.
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division; Electrical Engineering Program; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorBagci, Hakanen
dc.contributor.authorAndriulli, Francesco P.en
dc.contributor.authorVipiana, Francescaen
dc.contributor.authorVecchi, Giuseppeen
dc.contributor.authorMichielssen, Ericen
dc.date.accessioned2015-08-02T09:12:11Zen
dc.date.available2015-08-02T09:12:11Zen
dc.date.issued2010-05en
dc.identifier.issn15213323en
dc.identifier.doi10.1109/TADVP.2009.2033569en
dc.identifier.urihttp://hdl.handle.net/10754/561470en
dc.description.abstractA hierarchically regularized coupled set of time-domain surface and volume electric field integral-equations (TD-S-EFIE and TD-V-EFIE) for analyzing electromagnetic wave interactions with electrically small and geometrically intricate composite structures comprising perfect electrically conducting surfaces and finite dielectric volumes is presented. A classically formulated coupled set of TD-S- and V-EFIEs is shown to be ill-conditioned at low frequencies owing to the hypersingular nature of the TD-S-EFIE. To eliminate low-frequency breakdown in marching-on-in-time solvers for these coupled equations, a hierarchical regularizer leveraging generalized RaoWiltonGlisson functions is applied to the TD-S-EFIE; no regularization is applied to the TD-V-EFIE as it is protected from low-frequency breakdown by an identity term. The resulting hierarchically regularized hybrid TD-S- and V-EFIE solver is applicable to the analysis of wave interactions with electrically small and densely meshed structures of arbitrary topology. The accuracy, efficiency, and applicability of the proposed solver are demonstrated by analyzing crosstalk in a six-port transmission line, radiation from a miniature radio-frequency identification antenna, and, plane-wave coupling onto a partially-shielded and fully loaded two-layer computer board. © 2006 IEEE.en
dc.description.sponsorshipManuscript received December 04, 2008; revised July 16, 2009. Current version published May 05, 2010. This work was supported in part by AFOSR MURI under Grant F014432-051936 aimed at modeling installed antennas and their feeds and in part by the National Science Foundation under Grant DMS 0713771. This work was recommended for publication by Associate Editor A. Maffucci upon evaluation of the reviewers comments.en
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.subjectElectric field integral equation (EFIE)en
dc.subjectHierarchical methodsen
dc.subjectLow-frequency breakdownen
dc.subjectMarching-on-in-timeen
dc.subjectPreconditioneren
dc.subjectTime-domain analysisen
dc.titleA well-conditioned integral-equation formulation for efficient transient analysis of electrically small microelectronic devicesen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentElectrical Engineering Programen
dc.contributor.departmentComputational Electromagnetics Laboratoryen
dc.identifier.journalIEEE Transactions on Advanced Packagingen
dc.contributor.institutionRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109, United Statesen
dc.contributor.institutionAntenna and EMC Lab., Electronics Department, Politecnico di Torino, 10129 Torino, Italyen
dc.contributor.institutionAntenna and EMC Lab., Electronics Department, Politecnico di Torino, Torino 10129, Italyen
dc.contributor.institutionIstituto Superiore Mario, Torino 10138, Italyen
dc.contributor.institutionRadiation Laboratory, Department of Electrical Engineering and Computer Science, University of Michigan at Ann Arbor, Ann Arbor, MI 48109, United Statesen
kaust.authorBagci, Hakanen
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