The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses

Handle URI:
http://hdl.handle.net/10754/558857
Title:
The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses
Authors:
Zhou, Jian ( 0000-0003-0144-5901 ) ; Anjum, Dalaver H.; Chen, Long; Xu, Xuezhu; Ventura, Isaac Aguilar; Jiang, Long; Lubineau, Gilles ( 0000-0002-7370-6093 )
Abstract:
Poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) (PEDOT/PSS) is a widely used conductive polymer in the field of flexible electronics. The ways its microstructure changes over a broad range of temperatures remain unclear. This paper describes microstructure changes at different temperatures and correlates the microstructure with its physical properties (mechanical and electrical). We used High-Angle Annular Dark-Field Scanning Electron Microscopy (HAADF-STEM) combined with electron energy loss spectroscopy (EELS) to determine the morphology and elemental atomic ratio of the film at different temperatures. These results together with the Atomic Force Microscopy (AFM) analysis provide the foundation for a model of how the temperature affects the microstructure of PEDOT/PSS. Moreover, dynamic mechanical analysis (DMA) and electrical characterization were performed to analyze the microstructure and physical property correlations.
KAUST Department:
Physical Sciences and Engineering (PSE) Division; COHMAS Laboratory; Advanced Nanofabrication, Imaging and Characterization Core Lab
Citation:
The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses 2014, 2 (46):9903 J. Mater. Chem. C
Journal:
J. Mater. Chem. C
Issue Date:
24-Sep-2014
DOI:
10.1039/C4TC01593B
Type:
Article
ISSN:
2050-7526; 2050-7534
Additional Links:
http://xlink.rsc.org/?DOI=C4TC01593B
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorZhou, Jianen
dc.contributor.authorAnjum, Dalaver H.en
dc.contributor.authorChen, Longen
dc.contributor.authorXu, Xuezhuen
dc.contributor.authorVentura, Isaac Aguilaren
dc.contributor.authorJiang, Longen
dc.contributor.authorLubineau, Gillesen
dc.date.accessioned2015-07-05T12:34:04Zen
dc.date.available2015-07-05T12:34:04Zen
dc.date.issued2014-09-24en
dc.identifier.citationThe temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses 2014, 2 (46):9903 J. Mater. Chem. Cen
dc.identifier.issn2050-7526en
dc.identifier.issn2050-7534en
dc.identifier.doi10.1039/C4TC01593Ben
dc.identifier.urihttp://hdl.handle.net/10754/558857en
dc.description.abstractPoly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) (PEDOT/PSS) is a widely used conductive polymer in the field of flexible electronics. The ways its microstructure changes over a broad range of temperatures remain unclear. This paper describes microstructure changes at different temperatures and correlates the microstructure with its physical properties (mechanical and electrical). We used High-Angle Annular Dark-Field Scanning Electron Microscopy (HAADF-STEM) combined with electron energy loss spectroscopy (EELS) to determine the morphology and elemental atomic ratio of the film at different temperatures. These results together with the Atomic Force Microscopy (AFM) analysis provide the foundation for a model of how the temperature affects the microstructure of PEDOT/PSS. Moreover, dynamic mechanical analysis (DMA) and electrical characterization were performed to analyze the microstructure and physical property correlations.en
dc.relation.urlhttp://xlink.rsc.org/?DOI=C4TC01593Ben
dc.rightsArchived with thanks to J. Mater. Chem. Cen
dc.titleThe temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analysesen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.contributor.departmentCOHMAS Laboratoryen
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Laben
dc.identifier.journalJ. Mater. Chem. Cen
dc.eprint.versionPost-printen
dc.contributor.institutionNorth Dakota State University, Department of Mechanical Engineering, Fargo, USAen
kaust.authorZhou, Jianen
kaust.authorAnjum, Dalaver H.en
kaust.authorChen, Longen
kaust.authorVentura, Isaac Aguilaren
kaust.authorLubineau, Gillesen
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