Characterization of microcrystalline I-layer for solar cells prepared in low temperature - plastic compatible process

Handle URI:
http://hdl.handle.net/10754/555708
Title:
Characterization of microcrystalline I-layer for solar cells prepared in low temperature - plastic compatible process
Authors:
Sliz, Rafal; Ahnood, Arman; Nathan, Arokia; Myllyla, Risto; Jabbour, Ghassan E.
Abstract:
Microcrystalline silicon (mc-Si) lms deposited using a Plasma Enhanced Chemical Vapour Deposition (PECVD) process constitute an important material for manufacturing low-cost, large-area thin-lm devices, such as solar cells or thin-lm transistors. Although the deposition of electronic-grade mc-Si using the PECVD process is now well established, the high substrate temperature required (~400°C) does not lend itself to electronic devices with exible form factors fabricated on low-cost plastic substrates. In this study, we rst investigated an intrinsic mc-Si layer deposited at plastic-compatible substrate temperatures (~150°C) by characterising the properties of the lm and then evaluated its applicability to p-i-n solar cells though device characterisation. When the performance of the solar cell was correlated with lm properties, it was found that, although it compared unfavourably with mc-Si deposited at higher temperatures, it remained a very promising option. Nonetheless, further development is required to increase the overall eciency of mc-Si exible solar cells.
KAUST Department:
Solar and Photovoltaic Engineering Research Center (SPERC)
Citation:
Sliz, Rafal, Arman Ahnood, Arokia Nathan, Risto Myllyla, and Ghassan Jabbour. "Characterization of microcrystalline I-layer for solar cells prepared in low temperature-plastic compatible process." In SPIE Photonics Europe, pp. 84381E-84381E. International Society for Optics and Photonics, 2012
Publisher:
SPIE-Intl Soc Optical Eng
Journal:
Photonics for Solar Energy Systems IV
Conference/Event name:
Photonics for Solar Energy Systems IV
Issue Date:
1-Jun-2012
DOI:
10.1117/12.922302
Type:
Conference Paper
Additional Links:
http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1316618
Appears in Collections:
Conference Papers; Solar and Photovoltaic Engineering Research Center (SPERC)

Full metadata record

DC FieldValue Language
dc.contributor.authorSliz, Rafalen
dc.contributor.authorAhnood, Armanen
dc.contributor.authorNathan, Arokiaen
dc.contributor.authorMyllyla, Ristoen
dc.contributor.authorJabbour, Ghassan E.en
dc.date.accessioned2015-05-25T14:46:20Zen
dc.date.available2015-05-25T14:46:20Zen
dc.date.issued2012-06-01en
dc.identifier.citationSliz, Rafal, Arman Ahnood, Arokia Nathan, Risto Myllyla, and Ghassan Jabbour. "Characterization of microcrystalline I-layer for solar cells prepared in low temperature-plastic compatible process." In SPIE Photonics Europe, pp. 84381E-84381E. International Society for Optics and Photonics, 2012en
dc.identifier.doi10.1117/12.922302en
dc.identifier.urihttp://hdl.handle.net/10754/555708en
dc.description.abstractMicrocrystalline silicon (mc-Si) lms deposited using a Plasma Enhanced Chemical Vapour Deposition (PECVD) process constitute an important material for manufacturing low-cost, large-area thin-lm devices, such as solar cells or thin-lm transistors. Although the deposition of electronic-grade mc-Si using the PECVD process is now well established, the high substrate temperature required (~400°C) does not lend itself to electronic devices with exible form factors fabricated on low-cost plastic substrates. In this study, we rst investigated an intrinsic mc-Si layer deposited at plastic-compatible substrate temperatures (~150°C) by characterising the properties of the lm and then evaluated its applicability to p-i-n solar cells though device characterisation. When the performance of the solar cell was correlated with lm properties, it was found that, although it compared unfavourably with mc-Si deposited at higher temperatures, it remained a very promising option. Nonetheless, further development is required to increase the overall eciency of mc-Si exible solar cells.en
dc.publisherSPIE-Intl Soc Optical Engen
dc.relation.urlhttp://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=1316618en
dc.rightsArchived with thanks to Proceedings of SPIEen
dc.titleCharacterization of microcrystalline I-layer for solar cells prepared in low temperature - plastic compatible processen
dc.typeConference Paperen
dc.contributor.departmentSolar and Photovoltaic Engineering Research Center (SPERC)en
dc.identifier.journalPhotonics for Solar Energy Systems IVen
dc.conference.date2012-04-16 to 2012-04-18en
dc.conference.namePhotonics for Solar Energy Systems IVen
dc.conference.locationBrussels, BELen
dc.eprint.versionPublisher's Version/PDFen
dc.contributor.institutionOptoelectronics and Measurement Techniques Laboratory, University of Oulu, Erkki Koiso-Kanttilan katu 3, 90570 Oulu, Finlanden
dc.contributor.institutionCentre for Advanced Photonics and Electronics, Cambridge University, 9 JJ Thomson Avenue, Cambridge CB3 0FA, UKen
kaust.authorJabbour, Ghassan E.en
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