Electrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substrates

Handle URI:
http://hdl.handle.net/10754/552820
Title:
Electrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substrates
Authors:
Yao, Yingbang; Chen, Long; Wang, Zhihong; Alshareef, Husam N. ( 0000-0001-5029-2142 ) ; Zhang, Xixiang ( 0000-0002-3478-6414 )
Abstract:
(001)-oriented BiFeO 3 (BFO) thin films were grown on Sr xCa 1-xRuO 3- (SCRO; x = 1, 0.67, 0.33, 0) buffered SrTiO 3 (001) substrates using pulsed laser deposition. The microstructural, electrical, ferroelectric, and piezoelectric properties of the thin films were considerably affected by the buffer layers. The interface between the BFO films and the SCRO-buffer layer was found to play a dominant role in determining the electrical and piezoelectric behaviors of the films. We found that films grown on SrRuO 3-buffer layers exhibited minimal electrical leakage while films grown on Sr 0.33Ca 0.67RuO 3-buffer layers had the largest piezoelectric response. The origin of this difference is discussed. © 2012 American Institute of Physics.
KAUST Department:
Advanced Nanofabrication, Imaging and Characterization Core Lab; Materials Science and Engineering Program
Citation:
Electrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substrates 2012, 111 (11):114102 Journal of Applied Physics
Publisher:
AIP Publishing
Journal:
Journal of Applied Physics
Issue Date:
1-Jun-2012
DOI:
10.1063/1.4724332
Type:
Article
ISSN:
00218979
Additional Links:
http://scitation.aip.org/content/aip/journal/jap/111/11/10.1063/1.4724332
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab; Materials Science and Engineering Program

Full metadata record

DC FieldValue Language
dc.contributor.authorYao, Yingbangen
dc.contributor.authorChen, Longen
dc.contributor.authorWang, Zhihongen
dc.contributor.authorAlshareef, Husam N.en
dc.contributor.authorZhang, Xixiangen
dc.date.accessioned2015-05-14T08:32:30Zen
dc.date.available2015-05-14T08:32:30Zen
dc.date.issued2012-06-01en
dc.identifier.citationElectrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substrates 2012, 111 (11):114102 Journal of Applied Physicsen
dc.identifier.issn00218979en
dc.identifier.doi10.1063/1.4724332en
dc.identifier.urihttp://hdl.handle.net/10754/552820en
dc.description.abstract(001)-oriented BiFeO 3 (BFO) thin films were grown on Sr xCa 1-xRuO 3- (SCRO; x = 1, 0.67, 0.33, 0) buffered SrTiO 3 (001) substrates using pulsed laser deposition. The microstructural, electrical, ferroelectric, and piezoelectric properties of the thin films were considerably affected by the buffer layers. The interface between the BFO films and the SCRO-buffer layer was found to play a dominant role in determining the electrical and piezoelectric behaviors of the films. We found that films grown on SrRuO 3-buffer layers exhibited minimal electrical leakage while films grown on Sr 0.33Ca 0.67RuO 3-buffer layers had the largest piezoelectric response. The origin of this difference is discussed. © 2012 American Institute of Physics.en
dc.publisherAIP Publishingen
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/jap/111/11/10.1063/1.4724332en
dc.rightsArchived with thanks to Journal of Applied Physicsen
dc.titleElectrical and piezoelectric properties of BiFeO3 thin films grown on SrxCa1−xRuO3-buffered SrTiO3 substratesen
dc.typeArticleen
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Laben
dc.contributor.departmentMaterials Science and Engineering Programen
dc.identifier.journalJournal of Applied Physicsen
dc.eprint.versionPublisher's Version/PDFen
kaust.authorYao, Yingbangen
kaust.authorChen, Longen
kaust.authorWang, Zhihongen
kaust.authorAlshareef, Husam N.en
kaust.authorZhang, Xixiangen
All Items in KAUST are protected by copyright, with all rights reserved, unless otherwise indicated.