Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors

Handle URI:
http://hdl.handle.net/10754/552804
Title:
Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors
Authors:
Wang, Lei; Ma, Yanwei; Wang, Qingxiao; Li, Kun; Zhang, Xixiang ( 0000-0002-3478-6414 ) ; Qi, Yanpeng; Gao, Zhaoshun; Zhang, Xianping; Wang, Dongliang; Yao, Chao; Wang, Chunlei
Abstract:
We report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystallineSr0.6K0.4Fe2As2superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (Jc) of polycrystalline samples with respect to that of bicrystal films.
KAUST Department:
Advanced Nanofabrication, Imaging and Characterization Core Lab
Citation:
Direct observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors 2011, 98 (22):222504 Applied Physics Letters
Journal:
Applied Physics Letters
Issue Date:
1-Jun-2011
DOI:
10.1063/1.3592580
Type:
Article
ISSN:
00036951
Additional Links:
http://scitation.aip.org/content/aip/journal/apl/98/22/10.1063/1.3592580; http://arxiv.org/abs/1104.5372
Appears in Collections:
Articles; Advanced Nanofabrication, Imaging and Characterization Core Lab

Full metadata record

DC FieldValue Language
dc.contributor.authorWang, Leien
dc.contributor.authorMa, Yanweien
dc.contributor.authorWang, Qingxiaoen
dc.contributor.authorLi, Kunen
dc.contributor.authorZhang, Xixiangen
dc.contributor.authorQi, Yanpengen
dc.contributor.authorGao, Zhaoshunen
dc.contributor.authorZhang, Xianpingen
dc.contributor.authorWang, Dongliangen
dc.contributor.authorYao, Chaoen
dc.contributor.authorWang, Chunleien
dc.date.accessioned2015-05-14T07:19:15Zen
dc.date.available2015-05-14T07:19:15Zen
dc.date.issued2011-06-01en
dc.identifier.citationDirect observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductors 2011, 98 (22):222504 Applied Physics Lettersen
dc.identifier.issn00036951en
dc.identifier.doi10.1063/1.3592580en
dc.identifier.urihttp://hdl.handle.net/10754/552804en
dc.description.abstractWe report here an atomic resolution study of the structure and composition of the grain boundaries in polycrystallineSr0.6K0.4Fe2As2superconductor. A large fraction of grain boundaries contain amorphous layers larger than the coherence length, while some others contain nanometer-scale crystallites sandwiched in between amorphous layers. We also find that there is significant oxygen enrichment at the grain boundaries. Such results explain the relatively low transport critical current density (Jc) of polycrystalline samples with respect to that of bicrystal films.en
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/apl/98/22/10.1063/1.3592580en
dc.relation.urlhttp://arxiv.org/abs/1104.5372en
dc.rightsArchived with thanks to Applied Physics Lettersen
dc.titleDirect observation of nanometer-scale amorphous layers and oxide crystallites at grain boundaries in polycrystalline Sr1−xKxFe2As2 superconductorsen
dc.typeArticleen
dc.contributor.departmentAdvanced Nanofabrication, Imaging and Characterization Core Laben
dc.identifier.journalApplied Physics Lettersen
dc.eprint.versionPublisher's Version/PDFen
dc.contributor.institutionKey Laboratory of Applied Superconductivity, Institute of Electrical Engineering, Chinese Academy of Sciences, P.O. Box 2703, Beijing 100190, People's Republic of Chinaen
dc.contributor.institutionKey Laboratory of Applied Superconductivity, Institute of Electrical Engineering, Chinese Academy of Sciences, P.O. Box 2703, Beijing 100190, People's Republic of Chinaen
dc.identifier.arxividarXiv:1104.5372en
kaust.authorWang, Qingxiaoen
kaust.authorLi, Kunen
kaust.authorZhang, Xixiangen
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