Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Handle URI:
http://hdl.handle.net/10754/346722
Title:
Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry
Authors:
Liu, Hsiang-Lin; Shen, Chih-Chiang; Su, Sheng-Han; Hsu, Chang-Lung; Li, Ming-Yang; Li, Lain-Jong ( 0000-0002-4059-7783 )
Abstract:
Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
KAUST Department:
Physical Sciences and Engineering (PSE) Division
Citation:
Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry 2014, 105 (20):201905 Applied Physics Letters
Publisher:
AIP Publishing
Journal:
Applied Physics Letters
Issue Date:
17-Nov-2014
DOI:
10.1063/1.4901836
Type:
Article
ISSN:
0003-6951; 1077-3118
Additional Links:
http://scitation.aip.org/content/aip/journal/apl/105/20/10.1063/1.4901836
Appears in Collections:
Articles; Physical Sciences and Engineering (PSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorLiu, Hsiang-Linen
dc.contributor.authorShen, Chih-Chiangen
dc.contributor.authorSu, Sheng-Hanen
dc.contributor.authorHsu, Chang-Lungen
dc.contributor.authorLi, Ming-Yangen
dc.contributor.authorLi, Lain-Jongen
dc.date.accessioned2015-03-17T06:01:14Zen
dc.date.available2015-03-17T06:01:14Zen
dc.date.issued2014-11-17en
dc.identifier.citationOptical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry 2014, 105 (20):201905 Applied Physics Lettersen
dc.identifier.issn0003-6951en
dc.identifier.issn1077-3118en
dc.identifier.doi10.1063/1.4901836en
dc.identifier.urihttp://hdl.handle.net/10754/346722en
dc.description.abstractSpectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.en
dc.publisherAIP Publishingen
dc.relation.urlhttp://scitation.aip.org/content/aip/journal/apl/105/20/10.1063/1.4901836en
dc.rightsArchived with thanks to Applied Physics Lettersen
dc.titleOptical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometryen
dc.typeArticleen
dc.contributor.departmentPhysical Sciences and Engineering (PSE) Divisionen
dc.identifier.journalApplied Physics Lettersen
dc.eprint.versionPublisher's Version/PDFen
dc.contributor.institutionDepartment of Physics, National Taiwan Normal University, Taipei 11677, Taiwanen
dc.contributor.institutionDepartment of Physics, National Taiwan Normal University, Taipei 11677, Taiwanen
dc.contributor.institutionInstitute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwanen
dc.contributor.institutionInstitute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwanen
dc.contributor.institutionInstitute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwanen
dc.contributor.institutionInstitute of Atomic and Molecular Sciences, Academia Sinica, Taipei 10617, Taiwanen
dc.contributor.affiliationKing Abdullah University of Science and Technology (KAUST)en
kaust.authorLi, Lain-Jongen
All Items in KAUST are protected by copyright, with all rights reserved, unless otherwise indicated.