Integrated Cu-based TM-pass polarizer using CMOS technology platform

Handle URI:
http://hdl.handle.net/10754/310655
Title:
Integrated Cu-based TM-pass polarizer using CMOS technology platform
Authors:
Ng, Tien Khee ( 0000-0002-1480-6975 ) ; Khan, Mohammed Zahed Mustafa ( 0000-0002-9734-5413 ) ; Ooi, Boon S. ( 0000-0001-9606-5578 )
Abstract:
A transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2-1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors' knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.
KAUST Department:
Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division; Photonics Laboratory
Citation:
Tien KN, Zahed MK, Boon SO (2010) Integrated Cu-based TM-pass polarizer using CMOS technology platform. 2010 Photonics Global Conference. doi:10.1109/PGC.2010.5706134.
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Journal:
2010 Photonics Global Conference
Conference/Event name:
Photonics Global Conference (PGC), 2010
Issue Date:
2010
DOI:
10.1109/PGC.2010.5706134
Type:
Conference Paper
ISBN:
978-1-4244-9882-6
Sponsors:
KAUST - Academic Excellence Alliance (AEA) 2010 Grant
Additional Links:
http://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=5706134
Appears in Collections:
Conference Papers; Photonics Laboratory; Computer, Electrical and Mathematical Sciences and Engineering (CEMSE) Division

Full metadata record

DC FieldValue Language
dc.contributor.authorNg, Tien Kheeen
dc.contributor.authorKhan, Mohammed Zahed Mustafaen
dc.contributor.authorOoi, Boon S.en
dc.date.accessioned2013-12-29T12:10:58Z-
dc.date.available2013-12-29T12:10:58Z-
dc.date.issued2010en
dc.identifier.citationTien KN, Zahed MK, Boon SO (2010) Integrated Cu-based TM-pass polarizer using CMOS technology platform. 2010 Photonics Global Conference. doi:10.1109/PGC.2010.5706134.en
dc.identifier.isbn978-1-4244-9882-6en
dc.identifier.doi10.1109/PGC.2010.5706134en
dc.identifier.urihttp://hdl.handle.net/10754/310655en
dc.description.abstractA transverse-magnetic-pass (TM-pass) copper (Cu) polarizer is proposed and analyzed using the previously published two-dimensional Method-of-Lines beam-propagation model. The proposed polarizer exhibits a simulated high-pass filter characteristics, with TM0 and TE0 mode transmissivity of >70% and <5%, respectively, in the wavelength regime of 1.2-1.6 μm. The polarization extinction ratio (PER) given by 10 log10 (PTM0)/(PTE0) is +11.5 dB across the high-pass wavelength regime. To the best of the authors' knowledge, we report here the smallest footprint CMOS-platform compatible TM-polarizer.en
dc.description.sponsorshipKAUST - Academic Excellence Alliance (AEA) 2010 Granten
dc.language.isoenen
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en
dc.relation.urlhttp://ieeexplore.ieee.org/lpdocs/epic03/wrapper.htm?arnumber=5706134en
dc.titleIntegrated Cu-based TM-pass polarizer using CMOS technology platformen
dc.typeConference Paperen
dc.contributor.departmentComputer, Electrical and Mathematical Sciences and Engineering (CEMSE) Divisionen
dc.contributor.departmentPhotonics Laboratoryen
dc.identifier.journal2010 Photonics Global Conferenceen
dc.conference.date14-16 Dec. 2010en
dc.conference.namePhotonics Global Conference (PGC), 2010en
dc.conference.locationSingaporeen
dc.eprint.versionPublisher's Version/PDFen
kaust.authorNg, Tien Kheeen
kaust.authorKhan, Mohammed Zahed Mustafaen
kaust.authorOoi, Boon S.en
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